Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set

Authors:
Il-Soo Lee;Yu-Ting Lin;Anthony P. Ambler
Affiliations:
University of Texas at Austin;University of Texas at Austin;University of Texas at Austin
Venue:
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
Year:
2005

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Abstract

Reduction of power dissipation and test time is accomplished by forming two clusters of donýt-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.