Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Hierarchical Diagnosis of Identical Units in a System
IEEE Transactions on Computers
Fault Tolerance through Re-Execution in Multiscalar Architecture
DSN '00 Proceedings of the 2000 International Conference on Dependable Systems and Networks (formerly FTCS-30 and DCCA-8)
A method to enhance the fault coverage obtained by output response comparison of identical circuits
Proceedings of the IEEE International Test Conference 2001
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints
Journal of Electronic Testing: Theory and Applications
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Current designs may contain several identical copies of the same circuit (or functional unit). Such circuits can be tested by comparing the output vectors they produce under identical input vectors. This alleviates the need to observe the output response, and facilitates online testing. We show that testing of identical circuits by output comparison can be done effectively even when the input vectors applied to the circuits are not identical. This allows concurrent online testing even when the circuits are not driven from the same source during functional operation. We investigate several issues related to this observation. We investigate the use of both structural and functional analysis to identify situations where nonidentical input vectors can be used for fault detection based on output comparison. We also consider the use of observation points to improve the fault coverage. We present experimental results to support the discussion and the use of nonidentical input vectors for concurrent online testing of identical circuits.