An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance

Authors:
Tong-Yu Hsieh;Kuen-Jong Lee;Melvin A. Breuer
Affiliations:
National Cheng Kung University, Taiwan;National Cheng Kung University, Taiwan;University of Southern California
Venue:
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Year:
2006

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Abstract

Path delay fault simulation performance on multi-cycle delay paths common in industrial designs is discussed using paths from a large block in a microprocessor and a functional test vector suite. We profile fault simulation performance using a novel ...