Minimizing ohmic loss and supply voltage variation using a novel distributed power supply network

Authors:
M. Budnik;K. Roy
Affiliations:
Purdue University, West Lafayette, IN;Purdue University, West Lafayette, IN
Venue:
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Year:
2006

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Abstract

IR and di/dt events may cause ohmic losses and large supply voltage variations due to system parasitics. Today, parallelism in the power delivery path is used to reduce ohmic loss while decoupling capacitance is used to minimize the supply voltage variation. Future integrated circuits, however, will exhibit large enough currents and current transients to mandate additional safeguards. A novel, distributed power delivery and decoupling network is introduced reducing the supply voltage variation magnitude by 67% and the future ohmic loss by 15.9W (compared to today's power delivery and decoupling networks) using conventional processing and packaging techniques in a 130nm technology node.