IEEE Design & Test
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
Comparison of Defect Detection Capabilities of Current-Based and Voltage-Based Test Methods
ETW '00 Proceedings of the IEEE European Test Workshop
IEEE Transactions on Computers
Minimizing ohmic loss and supply voltage variation using a novel distributed power supply network
Proceedings of the conference on Design, automation and test in Europe: Proceedings
On efficient generation of instruction sequences to test for delay defects in a processor
Proceedings of the 18th ACM Great Lakes symposium on VLSI
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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We have witnessed an explosion of Internet use that has tremendous implications for our industry, particularly on the test requirements put upon us. At Intel we have a vision. We see a world in which we're marching toward a billion connected computers being served by high-performance networks and millions of servers. On those servers we see billions of transactions worth trillions of dollars, conducted on a daily and a yearly basis. This connected world is changing everything-everything that we do and everything that we need to deliver as an industry