Extended stuck-fault testability for combinational networks

  • Authors:
  • Patrick C. McGeer;Robert K. Brayton;Richard Rudell;A. Sangiovanni-Vincentelli

  • Affiliations:
  • -;-;-;-

  • Venue:
  • AUSCRYPT '90 Proceedings of the sixth MIT conference on Advanced research in VLSI
  • Year:
  • 1990

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Abstract