Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

• Authors:

• Manoj Sachdev;José Pineda de Gyvez

• Affiliations:

• -;-

• Venue:
• Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
• Year:
• 2007