Hierarchical Krylov subspace reduced order modeling of large RLC circuits
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Architecture-level thermal behavioral characterization for multi-core microprocessors
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
FEKIS: a fast architecture-level thermal analyzer for online thermal regulation
Proceedings of the 18th ACM Great Lakes symposium on VLSI
DeMOR: decentralized model order reduction of linear networks with massive ports
Proceedings of the 45th annual Design Automation Conference
ETBR: extended truncated balanced realization method for on-chip power grid network analysis
Proceedings of the conference on Design, automation and test in Europe
Multiple block structure-preserving reduced order modeling of interconnect circuits
Integration, the VLSI Journal
Hierarchical Krylov subspace based reduction of large interconnects
Integration, the VLSI Journal
Modeling and simulation for on-chip power grid networks by locally dominant Krylov subspace method
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
h2-norm optimal model reduction for large scale discrete dynamical MIMO systems
Journal of Computational and Applied Mathematics
Architecture-level thermal characterization for multicore microprocessors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Statistical analysis of large on-chip power grid networks by variational reduction scheme
Integration, the VLSI Journal
On passivity of the super node algorithm for EM modeling of interconnect systems
Proceedings of the Conference on Design, Automation and Test in Europe
Structure preserving model-order reductions of MIMO second-order systems using Arnoldi methods
Mathematical and Computer Modelling: An International Journal
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Towards improving simulation of analog circuits using model order reduction
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Computational and Applied Mathematics
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