Arithmetic built-in self-test for embedded systems
Arithmetic built-in self-test for embedded systems
Multi-Agent Systems: An Introduction to Distributed Artificial Intelligence
Multi-Agent Systems: An Introduction to Distributed Artificial Intelligence
Digital Hardware Testing: Transistor-Level Fault Modeling and Testing
Digital Hardware Testing: Transistor-Level Fault Modeling and Testing
A distributed BIST technique for diagnosis of MCM interconnections
ITC '98 Proceedings of the 1998 IEEE International Test Conference
An Effective Distributed BIST Architecture for RAMs
ETW '00 Proceedings of the IEEE European Test Workshop
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Itelligent Agents and BIST/BISR " Working Together in Distributed Systems
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
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This article demonstrates how to use intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) and BISR (Built-In Self-Repair) facilities. Agents are software modules that perform monitoring, diagnosis and repair of the faults. They form together a society whose members communicate, set goals and solve tasks. An experimental solution is presented, and future developments of the proposed approach are explored.