Design of Test Access Mechanism for AMBA-Based System-on-a-Chip

  • Authors:
  • Jaehoon Song;Piljae Min;Hyunbean Yi;Sungju Park

  • Affiliations:
  • Hanyang University, Korea;Hanyang University, Korea;Hanyang University, Korea;Hanyang University, Korea

  • Venue:
  • VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
  • Year:
  • 2007

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Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...