Towards trojan-free trusted ICs: problem analysis and detection scheme
Proceedings of the conference on Design, automation and test in Europe
The detection of Trojan horse based on the data mining
FSKD'09 Proceedings of the 6th international conference on Fuzzy systems and knowledge discovery - Volume 1
Scan-based attack against elliptic curve cryptosystems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Secure and testable scan design using extended de Bruijn graphs
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Secure scan design using shift register equivalents against differential behavior attack
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Balanced Secure Scan: Partial Scan Approach for Secret Information Protection
Journal of Electronic Testing: Theory and Applications
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Scan-based DFT enhances the testability of a system by making its internal nodes more observable and controllable. However, in case of a secure chip, scan chain increases its vulnerability to attack, where the attacker can extract secret information by scanning out states of internal nodes. This paper presents VIm-Scan: a low overhead scan design methodology that maintains all the advantages of a traditional scan-based testing yet prevents secure key extraction through the scan out process. Experimental results show that the proposed approach entails significantly lesser design overhead (~5X reduction in number of additional gates) with comparable or better protection against attack than existing techniques.