Runtime mechanisms for leakage current reduction in CMOS VLSI circuits1,2
Proceedings of the 2002 international symposium on Low power electronics and design
Leakage current reduction in CMOS VLSI circuits by input vector control
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Enhanced leakage reduction Technique by gate replacement
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 43rd annual Design Automation Conference
Heightening Security of P2P Networks by Neighborhood Key Method
ICINIS '08 Proceedings of the 2008 First International Conference on Intelligent Networks and Intelligent Systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Gate replacement techniques for simultaneous leakage and aging optimization
Proceedings of the Conference on Design, Automation and Test in Europe
Leakage power and circuit aging cooptimization by gate replacement techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hi-index | 0.00 |
Leakage power currently comprises a large fraction of the total power consumption of an IC. Techniques to minimize leakage have been researched widely. In this paper, we present an approach which minimizes leakage by simultaneously modifying the circuit while deriving the input vector that minimizes leakage. In our approach, we selectively modify a gate so that its output (in sleep mode) is in a state which helps minimize the leakage of other gates in its transitive fanout. Gate replacement is performed in a slack-aware manner, to minimize the resulting delay penalty.