A two-tone test method for continuous-time adaptive equalizers

Authors:
Dongwoo Hong;Shadi Saberi;Kwang-Ting (Tim) Cheng;C. Patrick Yue
Affiliations:
University of California, Santa Barbara, CA;Carnegie Mellon University, Pittsburgh, PA;University of California, Santa Barbara, CA;University of California, Santa Barbara, CA
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2007

Citing 2
Cited 2

Transmitter Equalization for 4-GBPS Signaling

IEEE Micro
Elimination of Traditional Functional Testing of Interface Timings at Intel

ITC '04 Proceedings of the International Test Conference on International Test Conference

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability
Multi-gigabit analog equalizers for plastic opticalfibers

Microelectronics Journal

Quantified Score

Hi-index	0.00

Visualization

Abstract

This paper describes a novel test method for continuous-time adaptive equalizers. This technique applies a two-sinusoidal-tone signal as stimulus and includes an RMS detector for testing, which incurs no performance degradation and a very small area overhead. To validate the technique, we used a recently published adaptive equalizer as our test case and conducted both behavioral and transistor-level simulations. Simulation results demonstrate that the technique is effective in detecting defects in the equalizer, which might not be easily detected by the conventional eye-diagram method.