Proceedings of the 20th annual conference on Integrated circuits and systems design
An evolutionary methodology for test generation for peripheral cores via dynamic FSM extraction
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Functional Verification of DMA Controllers
Journal of Electronic Testing: Theory and Applications
Software-Based Testing for System Peripherals
Journal of Electronic Testing: Theory and Applications
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Test of peripheral modules has not yet been deeply investigated by the research community. When embedded in a system on a chip, peripheral cores introduce new issues for post-production testing. A peripheral core embedded in a SoC requires a test set able to properly perform two different tasks: configure the device in different operation modes and properly exercise it. In this paper an automatic approach able to generate test sets for peripheral cores embedded in a SoC is described. The presented approach is based on an evolutionary algorithm that exploits high-level simulation and gathers coverage metrics information to produce the test sets. The method compares favorably with results obtained by hand.