An Analytical Model for Reliability Evaluation of NoC Architectures

Authors:
Atefe Dalirsani;Mohammad Hosseinabady;Zainalabedin Navabi
Affiliations:
University of Tehran, Iran;University of Tehran, Iran;University of Tehran, Iran
Venue:
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
Year:
2007

Citing 0
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Abstract

This paper proposes an analytical model to assess Reliability Factor of an NoC based System-on-Chip design. Reliability Factor is the probability that faults in the NoC infrastructure can be recovered without any effect on system functionality. The proposed method classifies switch faults of an NoC according to their impact on system functionality. Based on this classification, the contribution of each transient fault lowering the reliability of the NoC is calculated. This model can be used to decide which fault tolerant techniques cause more improvement on system reliability.