On-Chip Cache Device Scaling Limits and Effective Fault Repair Techniques in Future Nanoscale Technology

  • Authors:
  • David Roberts;Nam Sung Kim;Trevor Mudge

  • Affiliations:
  • University of Michigan;Intel Corporation;University of Michigan

  • Venue:
  • DSD '07 Proceedings of the 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools
  • Year:
  • 2007

Quantified Score

Hi-index 0.00

Visualization

Abstract

Electrical engineers have learned how to build amazingly complex systems by assembling transistors, wires, and passive components into intricate networks. While solidly founded in semiconductor physics, pure engineering has made possible the design of ...