Algorithms ror Designing Fault-Detection Experiments ror Sequential Machines

Authors:
D. E. Farmer
Affiliations:
Department of Electrical and Computer Engineering, Clarkson College of Technology
Venue:
IEEE Transactions on Computers
Year:
1973

Citing 5
Cited 5

Least Upper Bounds on Minimal Terminal State Experiments for Two Classes of Sequential Machines

Journal of the ACM (JACM)
Fault-detection experiments for sequential machines

Fault-detection experiments for sequential machines
Variable-Length Distinguishing Sequences and Their Application to the Design of Fault-Detection Experiments

IEEE Transactions on Computers
Fault detecting experiments for sequential circuits

SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
A strategy for detecting faults in sequential machines not possessing distinguishing sequences

AFIPS '70 (Fall) Proceedings of the November 17-19, 1970, fall joint computer conference

On Easily Diagnosable Sequential Machines

IEEE Transactions on Computers
On a Novel Approach of Fault Detection in an Easily Testable Sequential Machine with Extra Inputs and Extra Outputs

IEEE Transactions on Computers
SCIRTSS: A Search System for Sequential Circuit Test Sequences

IEEE Transactions on Computers
Easily Testable Sequential Machines with Extra Inputs

IEEE Transactions on Computers
Fault-Detection Experiments for Parallel-Decomposable Sequential Machines

IEEE Transactions on Computers

Quantified Score

Hi-index	15.00

Visualization

Abstract

In this paper we present algorithms for designing fault-detection experiments for sequential machines with special emphasis on the case in which the machine does not possess a distinguishing sequence. The length of an experiment is reduced through: 1) identifying each state with its own unique input/output set rather than using a common set for all states; 2) utilizing overlapping of the required input/output sequences so that a portion of the experiment serves more than one purpose; and 3) verifying the reference condition in which the machine is placed at many points in the experiment by as short a locating sequence as possible. Important distinctions are made between locating sequences of the type introduced in previous work and those defined and used here.