Digital Systems: Hardware Organization and Design
Digital Systems: Hardware Organization and Design
Problem-Solving Methods in Artificial Intelligence
Problem-Solving Methods in Artificial Intelligence
Algorithms ror Designing Fault-Detection Experiments ror Sequential Machines
IEEE Transactions on Computers
IEEE Transactions on Computers
A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits
IEEE Transactions on Computers
Algorithms for Detection of Faults in Logic Circuits
IEEE Transactions on Computers
Fault detecting experiments for sequential circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
Design of diagnosable sequential machines
AFIPS '67 (Spring) Proceedings of the April 18-20, 1967, spring joint computer conference
AFIPS '82 Proceedings of the June 7-10, 1982, national computer conference
ATWIG, an automatic test pattern generator with inherent guidance
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Evaluation of a fan out stem based fault simulation in sequential circuits
Mathematical and Computer Modelling: An International Journal
| Hi-index | 14.98 |
This paper describes SCIRTSS (a sequential circuit test search system). An analytical basis is given for using tree search techniques in determining test sequences for sequential circuits. The basic algorithm for the system of SCIRTSS programs is described and the extent to which the user can influence the search procedure is discussed. Included are the results of the application of SCIRTSS to eight sequential circuits of varying complexity on each one of which it succeeded in finding a fault detection sequence for at least 98 percent of the simple logical faults. This suggests that SCIRTSS can be effective on more complex LSI parts than other automatic test generation methods currently available. Breaking the tree search into two separate search procedures and partitioning circuits when possible into control and data sections are unique features which contribute to SCIRTSS efficiency.