ATWIG, an automatic test pattern generator with inherent guidance

Authors:
Erwin Trischler
Affiliations:
Siemens AG, Corporate Information Technology, Munich, West Germany
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

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Abstract

ATWIG is a heuristic automatic test pattern generator (ATG) which employs various types of guidance based on controllability and observability (C/O) measures and various heuristics fault' path and fault selection. Guided inconsistent path sensitization, a new method for low cost ATG, is discussed. A concurrent fault simulator is used to verify the generated test patterns. Experimental results show that ATWIG is very efficient in generating test patterns for combinational and low sequential circuits. Further improvements and heuristics are necessary for automatic test generation of highly sequential circuits. The relationship between C/O cost measures and A TWIG cost is discussed.