A Simplified Definition of Walsh Functions
IEEE Transactions on Computers
Syndrome-Testable Design of Combinational Circuits
IEEE Transactions on Computers
Complementary Function Approach to the Synthesis of Three-Level NAND Network
IEEE Transactions on Computers
A Practical Approach to Fault Detection in Combinational Networks
IEEE Transactions on Computers
Fault detecting experiments for sequential circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
Spectral Signature Testing of Multiple Stuck-at Faults in Irredundant Combinational Networks
IEEE Transactions on Computers
A unified view of test compression methods
IEEE Transactions on Computers
Syndrome signature in output compaction for VLSI BIST
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
IEEE Transactions on Computers
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Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.