Fault secure multiple-valued logic networks
MVL '78 Proceedings of the eighth international symposium on Multiple-valued logic
Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes
IEEE Transactions on Computers
A Totally Self-Checking 1-Out-of-3 Checker
IEEE Transactions on Computers
On Totally Self-Checking Checkers for Separable Codes
IEEE Transactions on Computers
Note on Self-Checking Checkers
IEEE Transactions on Computers
A Simple Self-Testing Decoder Checking Circuit
IEEE Transactions on Computers
Multivalued Integrated Injection Logic
IEEE Transactions on Computers
Testing of a parallel ternary multiplier using I/sup 2/L logic
ATS '95 Proceedings of the 4th Asian Test Symposium
The Prospects for Multivalued Logic: A Technology and Applications View
IEEE Transactions on Computers
| Hi-index | 14.98 |
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.