Design of Fast Self-Testing Checkers for a Class of Berger Codes
IEEE Transactions on Computers
Generalized modular design of testable m-out-of-n code checker
ATS '95 Proceedings of the 4th Asian Test Symposium
The design of totally self-checking checkers for some classes of Hadamard codes
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Design of Totally Self-Checking Checker for 1-out-of-3 Code
IEEE Transactions on Computers
A New Design Method for m-Out-of-n TSC Checkers
IEEE Transactions on Computers
Fast and Efficient Totally Self-Checking Checkers for m-out-of-(2m ± 1) Codes
IEEE Transactions on Computers
Efficient Design of Self-Checking Checker for any m-Out-of-n Code
IEEE Transactions on Computers
A Totally Self-Checking 1-Out-of-3 Checker
IEEE Transactions on Computers
PLA Implementation of k-out-of-n Code TSC Checker
IEEE Transactions on Computers
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor
IEEE Transactions on Computers
Multivalued I2L Circuits for TSC Checkers
IEEE Transactions on Computers
Comments on "Asynchronous Sequential Machines Designed for Fault Detection"
IEEE Transactions on Computers
Totally Self-Checking Checker for 1-out-of-n Code Using Two-Rail Codes
IEEE Transactions on Computers
On Totally Self-Checking Checkers for Separable Codes
IEEE Transactions on Computers
| Hi-index | 15.02 |
Totally self-checking checkers for k-out-of-(2k + 1), (k + 1)-out-of-(2k + 1), and k-out-of-2k codes are given. The new checkers for the k-out-of-2k codes require only 2k tests to detect all stuck-at faults.