A New Design Method for m-Out-of-n TSC Checkers

Authors:
N. Gaitanis;C. Halatsis
Affiliations:
Digital Systems Laboratory Computer Center, N. R. C. Democritos, Aghia Paraskevi Attikis;-
Venue:
IEEE Transactions on Computers
Year:
1983

Citing 4
Cited 4

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Efficient Design of Self-Checking Checker for any m-Out-of-n Code

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Design of Fast Self-Testing Checkers for a Class of Berger Codes

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PLA Implementation of k-out-of-n Code TSC Checker

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System-on-Chip Test Architectures: Nanometer Design for Testability

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On CMOS totally self-checking circuits

ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production

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Abstract

The paper presents a new method for designing efficient TSC checkers for m-out-of n codes. The method is based on the partitioning of the input code variables into an arbitrary number of r classes. The paper establishes the necessary design conditions that must hold among m, n and r. The checker is basically composed of an m/n to l/z subchecker concatenated with an l/z to 1/2 subchecker. A cost analysis performed reveals that the most economical checkers are obtained for values of r equal to 3, or 4 for the majority of m/n codes with n = 4m. Comparison with earlier designs reveals impressive improvement both in logic complexity and testing complexity.