Graphs and Hypergraphs
Design of a Self-Checking Microprogram Control
IEEE Transactions on Computers
Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes
IEEE Transactions on Computers
Note on Self-Checking Checkers
IEEE Transactions on Computers
Realization of Fail-Safe Sequential Machines by Using a k-out-of-n Code
IEEE Transactions on Computers
Derivation of Minimum Test Sets for Unate Logical Circuits
IEEE Transactions on Computers
Complete Test Sets for Logic Functions
IEEE Transactions on Computers
Derivation of Minimal Test Sets for Monotonic Logic Circuits
IEEE Transactions on Computers
Universal Test Sets for Logic Networks
IEEE Transactions on Computers
Design of Fast Self-Testing Checkers for a Class of Berger Codes
IEEE Transactions on Computers
Generalized modular design of testable m-out-of-n code checker
ATS '95 Proceedings of the 4th Asian Test Symposium
A New Design Method for m-Out-of-n TSC Checkers
IEEE Transactions on Computers
IEEE Transactions on Computers
Fast and Efficient Totally Self-Checking Checkers for m-out-of-(2m ± 1) Codes
IEEE Transactions on Computers
PLA Implementation of k-out-of-n Code TSC Checker
IEEE Transactions on Computers
Design and Application of Self-Testing Comparators Implemented with MOS PLA's
IEEE Transactions on Computers
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor
IEEE Transactions on Computers
A Theory of Totally Self-Checking System Design
IEEE Transactions on Computers
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
| Hi-index | 15.01 |
The use of self-checking checkers in the design of highly reliable systems has many significant advantages. It allows errors to be detected upon occurrence without testing, whether the error is caused by a permanent or intermittent fault. However, there are relatively few codes for which efficient self-checking checkers have been designed. In this paper we present procedures for designing efficient self-checking checkers for m-out-of-n codes (i.e., codes where each valid code word consists of m bits with value 1 and n - m bits with value 0). Codes for arbitrary values of m and n are considered. Realizations which require significantly less logic than previously known realizations are presented for all cases except n = 2m and m = 1. These checkers are totally self-checking for all single and unidirectional multiple stuck-type faults. They are also very easy to test compared with previously presented realizations. Saving in logic complexity and testing complexity of 70 to 97 percent is demonstrated.