A New Approach to the Fault Location of Combinational Circuits
IEEE Transactions on Computers
Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
Locatability of Faults in Combinational Networks
IEEE Transactions on Computers
Algorithms for Detection of Faults in Logic Circuits
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
Designing Sets of Fault-Detection Tests ror Combinational Logic Circuits
IEEE Transactions on Computers
Detection of Multiple Faults in Combinational Logic Networks
IEEE Transactions on Computers
Controllability and Fault Observability in Modular Combinational Circuits
IEEE Transactions on Computers
| Hi-index | 14.98 |
When a specific type of network is required, the function to be realized limits the amount of fault tolerance that can be achieved. Parameters of functions that affect the maximum obtainable fault tolerance and the maximum obtainable diagnosability are investigated for several types of combinational memoryless) networks.