IEEE Transactions on Very Large Scale Integration (VLSI) Systems
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
Hotspot: acompact thermal modeling methodology for early-stage VLSI design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IC thermal simulation and modeling via efficient multigrid-based approaches
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
High-Efficiency Green Function-Based Thermal Simulation Algorithms
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The capability of predicting the temperature profile is critically important for circuit timing estimation, leakage reduction, power estimation, hotspot avoidance, and reliability concerns during modern IC designs. This paper presents an accurate and fast analytical full-chip thermal simulator for the early-stage temperature-aware chip design. By using the technique of generalized integral transforms (GIT), our proposed method can accurately estimate the temperature distribution of full-chip with very small truncation points of bases in the spatial domain. We also develop a fast Fourier transform (FFT) like evaluating algorithm to efficiently evaluate the temperature distribution. Experimental results confirm that our GIT based analyzer can achieve an order of magnitude speedup compared with a highly efficient Green's function based method.