SPICE-Compatible Thermal Simulation with Lumped Circuit Modeling for Thermal Reliability Analysis Based on Modeling Order Reduction

  • Authors:
  • Ting-Yuan Wang;Charlie Chung-Ping Chen

  • Affiliations:
  • -;-

  • Venue:
  • ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
  • Year:
  • 2004

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Abstract

With the growing power dissipation in modern high performance VLSI designs, nonuniform temperature distribution and limited heat-conduction capability have caused thermal inducedperformance and reliability degradation. However, the problem modeled by finite difference method for interconnect reliability analysis has huge size if we require the resolution with wirewidth. In addition, the generated lumped circuit has significant number of input sources, and the bottleneck of traditional model reduction methods is the big number of input ports. In this paper, we propose a method of SPICE-compatible thermal simulation for interconnect reliability analysis. The lumped thermal circuit modeling with adaptive approach is used to reduce the problem size. The improved extended Krylov subspace (IEKS) method, independent of the number of input ports, is used for thermal simulation. The experimental results show that our method provides highly accurate results with performance improvement 15脳 over T-Spice for the problem with node number 72428.