On the Use of Counters for Reproducing Deterministic Test Sets
IEEE Transactions on Computers
A Deterministic Built-In Self-Test Generator Based on Cellular Automata Structures
IEEE Transactions on Computers
Accumulator based deterministic BIST
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test Vector Embedding into Accumulator-Generated Sequences: A Linear-Time Solution
IEEE Transactions on Computers
Error correcting arithmetic coding for JPEG 2000: memory and performance analysis
MobiMedia '06 Proceedings of the 2nd international conference on Mobile multimedia communications
On the design of optimal counter-based schemes for test set embedding
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test embedding with discrete logarithms
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The problem of reliability in current chips has been the subject of numerous researchers. Mobile devices, commonly used in multimedia communications require low power during both normal operation and testing. In this paper a novel algorithm is presented for embedding test sets containing don't care values into sequences generated by binary counters. Therefore, both test time and power consumed during testing of the chips can be considerably reduced.