Graph based test case generation for TLM functional verification

  • Authors:
  • Mohammad Reza Kakoee;M. H. Neishaburi;Siamak Mohammadi

  • Affiliations:
  • Nanoelectronics Center of Excellence, School of Electrical and Computer Engineering, University of Tehran, Iran;Nanoelectronics Center of Excellence, School of Electrical and Computer Engineering, University of Tehran, Iran;Nanoelectronics Center of Excellence, School of Electrical and Computer Engineering, University of Tehran, Iran

  • Venue:
  • Microprocessors & Microsystems
  • Year:
  • 2008

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Abstract

Describing complex systems at a high level of abstraction provides designers with the possibility of exploring multiple SoC design architectures before committing to the low level-details of a complete implementation. Transaction level modeling understandably expedites the design simulation and verification. During the verification process, generating good test cases plays a significant role in determining the quality of the design. Inadequate test cases may cause bugs to remain. In this paper, first, in order to generate test cases for a TL model, we present a Control-Transaction Graph (CTG) which describes the behavior of a TL Model. A Control Graph is a control flow graph of a module in the design and transactions represent the interactions such as synchronization between modules. Second, we define dependent paths (DePaths) on the CTG as test cases for a transaction level model, which can find communication errors in simulation. We also give coverage metrics for a TL model to measure the quality of the generated test cases. Finally, we apply our method on the SystemC model of AMBA-AHB bus and JPEG encoder and generate test cases based on the CTG of these models.