Evolutionary algorithms in theory and practice: evolution strategies, evolutionary programming, genetic algorithms
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Diagnosis Strategies for Hardware or Software Systems
Journal of Electronic Testing: Theory and Applications
A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
Test Set Embedding Based on Phase Shifters
EDCC-4 Proceedings of the 4th European Dependable Computing Conference on Dependable Computing
Fast and Low-Area TPGs Based on T-Type Flip-Flops can be Easily Integrated to the Scan Path
ETW '00 Proceedings of the IEEE European Test Workshop
An artificial intelligence approach to the efficiency improvement of a universal motor
Engineering Applications of Artificial Intelligence
Efficient BIST TPG design and test set compaction via input reduction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper an approach for the generation of deterministic test pattern generator logic composed of D-type and T-type flip-flops is described. The approach employs a genetic algorithm to find an acceptable practical solution in a large space of possible implementations. In contrast to conventional approaches our genetic algorithm approach reduces the gate count of built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution. Results of experiments with combinational benchmarks demonstrate the efficiency of the proposed evolutionary approach.