A synthesis-based test generation and compaction algorithm for multifaults

Authors:
Srinivas Devadas;Kurt Keutzer;Sharad Malik
Affiliations:
Department of EECS, MIT, Cambridge, MA;Synopsys, Mountain View, CA;Department of EE, Princeton University, NJ
Venue:
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Year:
1991

Citing 4
Cited 1

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Abstract