Test set compaction algorithms for combinational circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Input necessary assignments for testing of path delay faults in standard-scan circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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A necessary assignment for a fault f is a line value that must be assigned by a test vector that detects f. A higher number of necessary assignments translates into a lower test generation effort since the test generation process has a larger number of values that it must assign, and therefore, fewer options that it can explore. To increase the number of available necessary assignments, we define approximate necessary assignments as line values that are assigned by most of the test vectors for a fault. We describe a heuristic procedure for computing approximate necessary assignments for inputs and demonstrate their effectiveness in reducing the test generation effort of a random test generation process.