A Testable Design of Logic Circuits Under Highly Observable Condition

Authors:
Wen Xiaoqing;Kozo Kinoshita
Affiliations:
-;-
Venue:
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Year:
1992

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Abstract

The concept of k-UCP circuits is proposed. In a k-UCP circuit, all stuck-at faults and stuck-open faults can be detected and located by k+1 and k(k+1)+1 tests, respectively, under the highly observable condition. A method of modifying an arbitrary combinational circuit into a k-UCP circuit is also proposed.