A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
Automated synthesis of large phase shifters for built-in self-test
ITC '98 Proceedings of the 1998 IEEE International Test Conference
10.2 Design of Phase Shifters for BIST Applications
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Pseudorandom Test Pattern Generators for Built-in Self-Testing: A Power Reduction Method
Automation and Remote Control
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