A structured and scalable mechanism for test access to embedded reusable cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Wrapper Design for Embedded Core Test
ITC '00 Proceedings of the 2000 IEEE International Test Conference
On Using Rectangle Packing for SOC Wrapper/TAM Co-Optimization
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Control-Aware Test Architecture Design for Modular SOC Testing
ETW '03 Proceedings of the 8th IEEE European Test Workshop
Design and test of a scalable security processor
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
DFT Infrastructure for Broadside Two-Pattern Test of Core-Based SOCs
IEEE Transactions on Computers
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
ASP-DAC '07 Proceedings of the 2007 Asia and South Pacific Design Automation Conference
STEAC: a platform for automatic SOC test integration
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Rapid advances in semi-conductor technology have made timing-related defects increasingly crucial in core-based system-on-chip designs. Currently, modular test strategies based on IEEE Standard 1500 are applied to test the functionality of each embedded core in system-on-chip (SoC) designs but fail to verify the corresponding timing specifications. In this paper, to achieve high quality of delay tests, hard-ware implementation of an embedded Delay Test Framework including the modified test wrappers and the Embedded delay test mechanism is presented to build an entirely embedded delay test environment where at-speed clock is applied inside the chip to increase test accuracy. Additionally, the proposed delay test framework is capable of supporting all current solutions of core-based delay test. The experimental results successfully demonstrate the delay testing application using the proposed framework to a Crypto Processor with satisfying test quality and effectiveness.