SVM-based feature extraction for face recognition

  • Authors:
  • Sang-Ki Kim;Youn Jung Park;Kar-Ann Toh;Sangyoun Lee

  • Affiliations:
  • Biometrics Engineering Research Center, School of Electrical & Electronic Engineering, Yonsei University, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Republic of Korea;Biometrics Engineering Research Center, School of Electrical & Electronic Engineering, Yonsei University, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Republic of Korea;Biometrics Engineering Research Center, School of Electrical & Electronic Engineering, Yonsei University, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Republic of Korea;Biometrics Engineering Research Center, School of Electrical & Electronic Engineering, Yonsei University, 134 Shinchon-dong, Seodaemun-gu, Seoul 120-749, Republic of Korea

  • Venue:
  • Pattern Recognition
  • Year:
  • 2010

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Abstract

The primary goal of linear discriminant analysis (LDA) in face feature extraction is to find an effective subspace for identity discrimination. The introduction of kernel trick has extended the LDA to nonlinear decision hypersurface. However, there remained inherent limitations for the nonlinear LDA to deal with physical applications under complex environmental factors. These limitations include the use of a common covariance function among each class, and the limited dimensionality inherent to the definition of the between-class scatter. Since these problems are inherently caused by the definition of the Fisher's criterion itself, they may not be solvable under the conventional LDA framework. This paper proposes to adopt a margin-based between-class scatter and a regularization process to resolve the issue. Essentially, we redesign the between-class scatter matrix based on the SVM margins to facilitate an effective and reliable feature extraction. This is followed by a regularization of the within-class scatter matrix. Extensive empirical experiments are performed to compare the proposed method with several other variants of the LDA method using the FERET, AR, and CMU-PIE databases.