Analysis and design of voltage-controlled oscillator based analog-to-digital converter

  • Authors:
  • Jaewook Kim;Tae-Kwang Jang;Young-Gyu Yoon;SeongHwan Cho

  • Affiliations:
  • Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, Korea;Samsung Electronics Company Ltd., Giheung, Korea;Medical System Research Group, KAIST Institute, Daejeon, Korea;Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, Daejeon, Korea

  • Venue:
  • IEEE Transactions on Circuits and Systems Part I: Regular Papers
  • Year:
  • 2010

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Abstract

A voltage-controlled oscillator (VCO) based analog-to-digital converter (ADC) is a time-based architecture with a first-order noise-shaping property, which can be implemented using a VCO and digital circuits. This paper analyzes the performance of VCO-based ADCs in the presence of nonidealities such as jitter, nonlinearity, mismatch, and the metastability of D flip-flops. Based on this analysis, design criteria for determining parameters for VCO-based ADCs are described. In addition, a digital calibration technique to enhance the spurious-free dynamic range degraded by the nonlinearity is also introduced. To verify the theoretical analysis, a prototype chip is implemented in a 0.13-µm CMOS process. With a 500-MHz sampling frequency, the prototype achieves a signal-to-noise ratio ranging from 71.8 to 21.3 dB for an input bandwidth of 100 kHz-247 MHz, while dissipating 12.6 mW and occupying an area of 0.078 mm2.