Design for testability view on placement and routing

Design for manufacturability in submicron domain

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout

DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Testability-oriented channel routing

VLSID '95 Proceedings of the 8th International Conference on VLSI Design

Incorporating Physical Design-For-Test Into Routing

ITC '97 Proceedings of the 1997 IEEE International Test Conference