An RDL-configurable 3D memory tier to replace on-chip SRAM

  • Authors:
  • Marco Facchini;Pol Marchal;Francky Catthoor;Wim Dehaene

  • Affiliations:
  • IMEC - Interuniversity MicroElectronics Center, Kapeldreef, Heverlee, Belgium and ESAT-MICAS Katholieke University Leuven, Kasteelpark Aremberg, Heverlee, Belgium;IMEC - Interuniversity MicroElectronics Center, Kapeldreef, Heverlee, Belgium;IMEC - Interuniversity MicroElectronics Center, Kapeldreef, Heverlee, Belgium;ESAT-MICAS Katholieke University Leuven, Kasteelpark Aremberg, Heverlee, Belgium

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

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Abstract

In a conventional SoC designs, on-chip memories occupy more than the 50% of the total die area. 3D technology enables the distribution of logic and memories on separate stacked dies (tiers). This allows redesigning the memory tier as a configurable product to be used in multiple system designs. Previously proposed dynamic re-configurable solutions demonstrate strong dependence between read latency and dimensions of the mapped memory, leading to potential performance limitations. In this paper we propose a one-time configurable memory tier designed to minimize the performances overhead due to the commodity. Flexible configuration is enabled by smart memory macros and I/Os organization and a customizable redistribution layer routing. With respect to the dynamic re-configurability, the proposed design offers up to 40% faster access time, while saving more than 10% of energy per access. In addition production cost trade offs are analyzed.