Validation with guided search of the state space
DAC '98 Proceedings of the 35th annual Design Automation Conference
On Combining Formal and Informal Verification
CAV '97 Proceedings of the 9th International Conference on Computer Aided Verification
StressTest: an automatic approach to test generation via activity monitors
Proceedings of the 42nd annual Design Automation Conference
Distance-guided hybrid verification with GUIDO
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Guiding simulation with increasingly refined abstract traces
Proceedings of the 43rd annual Design Automation Conference
Computer Architecture, Fourth Edition: A Quantitative Approach
Computer Architecture, Fourth Edition: A Quantitative Approach
An effective guidance strategy for abstraction-guided simulation
Proceedings of the 44th annual Design Automation Conference
Efficient design validation based on cultural algorithms
Proceedings of the conference on Design, automation and test in Europe
Microprocessor Verification via Feedback-Adjusted Markov Models
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
In order to combine the power of simulation-based and formal techniques, semi-formal methods have been widely explored. Among these methods, abstraction-guided simulation is a quite promising one. In this paper, we propose an abstraction-guided simulation approach aiming to cover hard-to-reach states in functional verification of microprocessors. A Markov model is constructed utilizing the high level functional specification, i.e. ISA. Such model integrates vector correlations. Furthermore, several strategies utilizing abstraction information are proposed as an effective guidance to the test generation. Experimental results on two complex microprocessors show that our approach is more efficient in covering hard-to-reach states than similar methods. Comparing with some work with other intelligent engines, our approach could guarantee higher hit ratio of target states without efficiency loss.