Improving compressed test pattern generation for multiple scan chain failure diagnosis

Authors:
Xun Tang;Ruifeng Guo;Wu-Tung Cheng;Sudhakar M. Reddy
Affiliations:
University of Iowa, Iowa City, IA;Mentor Graphics Corporation, Wilsonville, OR;Mentor Graphics Corporation, Wilsonville, OR;University of Iowa, Iowa City, IA
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2009

Citing 7
Cited 1

Diagnosing scan chain faults

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Analysis and Design of Optimal Combinational Compactors

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Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains

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Broadcasting test patterns to multiple circuits

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Embedded deterministic test

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Diagnosis of Multiple Scan Chain Timing Faults

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An ATE assisted DFD technique for volume diagnosis of scan chains

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Abstract

To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the errors in responses due to defects which are captured in scan cells are not directly observed. We propose a simple and effective way to enhance the diagnostic resolution achievable by production tests with minimal increase in pattern counts. In this work we present experimental results for the case of multiple scan chain faults to demonstrate the effectiveness of the proposed method.