Testability strategy of the Alpha AXP 21164 microprocessor

Authors:
Dilip K. Bhavsar;John H. Edmondson
Affiliations:
Digital Equipment Corporation, Semiconductor Operations, Hudson, MA;Digital Equipment Corporation, Semiconductor Operations, Hudson, MA
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

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Abstract

This paper describes the testability strategy and design-for-test features of the Alpha AXP 21164 microprocessor. It discusses the specific testability and manufacturability issues of the chip and the innovative solutions employed to solve them.