Model generation of test logic for macrocell based designs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
Alpha 21164 Testability Strategy
IEEE Design & Test
Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability
IEEE Design & Test
Aliasing Error for a Mask ROM Built-In Self-Test
IEEE Transactions on Computers
DPDAT: DATA PATH DIRECT ACCESS TESTING
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Testability strategy of the Alpha AXP 21164 microprocessor
ITC'94 Proceedings of the 1994 international conference on Test
Multi-frequency, multi-phase scan chain
ITC'94 Proceedings of the 1994 international conference on Test
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