RTG: automatic register level test generator
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
EBT: A comprehensive test generation technique for highly sequential circuits
DAC '78 Proceedings of the 15th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
The Weighted Random Test-Pattern Generator
IEEE Transactions on Computers
A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits
IEEE Transactions on Computers
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