On the testing of multiplexers

Authors:
Samy R. Makar;Edward J. McCluskey
Affiliations:
Center for Reliable Computing, Department of Electrical Engineering and Computer Science, Stanford University, Stanford, CA;Center for Reliable Computing, Department of Electrical Engineering and Computer Science, Stanford University, Stanford, CA
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

Minimal, pseudo-exhaustive and pseudo-random test patterns are generated for different multiplexers. Fault coverage of these patterns is discussed. Test length requirements (to achieve 100% fault coverage of single stuck-at faults) for different generation techniques are compared.