Testing for bridging faults (shorts) in CMOS circuits
DAC '83 Proceedings of the 20th Design Automation Conference
Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines
IEEE Transactions on Computers
IEEE Transactions on Computers
Optimum test patterns for parity networks
AFIPS '70 (Fall) Proceedings of the November 17-19, 1970, fall joint computer conference
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Comparison of Bridging Fault Simulation Methods
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of pseudo-exhaustive test sets. Real chips of ten contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudoexhaustive test sets are easy to generate and require little, or no, fault simulation. Feedback bridging faults are unexpectedly easy to detect. Criteria have been found for identifying bridging faults unlikely to be detected by test sets. Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested.