An industrial perspective of 3D IC integration technology: from the viewpoint of design technology

Authors:
Kyu-Myung Choi
Affiliations:
Samsung Electronics, Co., Ltd.
Venue:
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Year:
2010

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Abstract

3D IC integration is very important to overcome the technology scaling barriers and to satisfy mobile devices' demand. In this paper, we describe the challenges we are facing in developing 3D IC design methodology, especially in the case of TSV-SiP (Logic-Memory die stacking). Also, appropriate development approaches are proposed. The EDA tools for TSV-SiP, which are initially provided by extending current conventional tools, will be gradually enhanced to better support 3D IC designs.