Automatic test pattern generation for asynchronous networks

Authors:
Bryan J. Heard;Ramu N. Sheshadri;Ronald B. David;Arvid G. Sammuli
Affiliations:
Burroughs Micro-Component Group, San Diego, California;Burroughs Micro-Component Group, San Diego, California;Burroughs Micro-Component Group, San Diego, California;Burroughs Micro-Component Group, San Diego, California
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

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Abstract

A general description of asynchronous sequential circuits and their testability problems is given. A set of hardware modifications and software modelling techniques is described which allow asynchronous circuits to be tested by scan design techniques.