FPGA device and architecture evaluation considering process variations
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
An adaptive FPGA architecture with process variation compensation and reduced leakage
Proceedings of the 43rd annual Design Automation Conference
Performance and yield enhancement of FPGAs with within-die variation using multiple configurations
Proceedings of the 2007 ACM/SIGDA 15th international symposium on Field programmable gate arrays
Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays
FPGA design for timing yield under process variations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Measuring the Gap Between FPGAs and ASICs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Uncertainty in performance of FPGAs is becoming an important issue due to increased process variations in nanometer regime. Therefore, it is vital to decrease the impact of variability in these devices. FPGA routing architecture enhancement can be an effective way, because as feature size scales down, routing delay dominates logic circuit delay. In this paper, unidirectional and bidirectional routing architectures are compared. We show that bidirectional architecture is better in terms of robustness against variation when short wire segments are considered. However as wire length increases, unidirectional routing architecture would be the preferred option. Experimental results show that in unidirectional routing architecture towards bidirectional for wire length of 8, it has obtained 36% and 20% improvement in standard deviation and 3¼+Ã of circuit delay, respectively.