Transistor leakage fault location with ZDDQ measurement
ATS '95 Proceedings of the 4th Asian Test Symposium
Iddq Testing for High Performance CMOS - The Next Ten Years
EDTC '96 Proceedings of the 1996 European conference on Design and Test
A Production-Oriented Measurement Method for Fast and Exhaustive Iddq Tests
EDTC '97 Proceedings of the 1997 European conference on Design and Test
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Test Strategy Sensitivity to Defect Parameters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A serially addressable, flexible current monitor for test fixture based IDDQ/ISSQtesting
ITC'94 Proceedings of the 1994 international conference on Test
Defect classes - an overdue paradigm for CMOS IC testing
ITC'94 Proceedings of the 1994 international conference on Test
Is IDDQ yield loss inevitable?
ITC'94 Proceedings of the 1994 international conference on Test
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